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 Philips Semiconductors
Product specification
10-bit bus interface latch (3-State)
74ABT841
FEATURES
* High speed parallel latches * Extra data width for wide address/data paths or buses carrying
parity
DESCRIPTION
The 74ABT841 Bus interface register is designed to provide extra data width for wider data/address paths of buses carrying parity. The 74ABT841 consists of ten D-type latches with 3-State outputs. The flip-flops appear transparent to the data when Latch Enable (LE) is High. This allows asynchronous operation, as the output transition follows the data in transition. On the LE High-to-Low transition, the data that meets the setup and hold time is latched. Data appears on the bus when the Output Enable (OE) is Low. When OE is High the output is in the High-impedance state.
* Ideal where high speed, light loading, or increased fan-in are
required with MOS microprocessors
* Slim DIP 300 mil package * Broadside pinout * Output capability: +64mA/-32mA * Latch-up protection exceeds 500mA per Jedec Std 17 * ESD protection exceeds 2000 V per MIL STD 883 Method 3015
and 200 V per Machine Model
* Power-up 3-State * Power-up reset
QUICK REFERENCE DATA
SYMBOL tPLH tPHL CIN COUT ICCZ PARAMETER Propagation delay Dn to Qn Input capacitance Output capacitance Total supply current CONDITIONS Tamb = 25C; GND = 0V CL = 50pF; VCC = 5V VI = 0V or VCC Outputs disabled; VO = 0V or VCC Outputs disabled; VCC = 5.5V TYPICAL 4.1 4 7 500 UNIT ns pF pF nA
ORDERING INFORMATION
PACKAGES 24-Pin Plastic DIP 24-Pin plastic SO 24-Pin Plastic SSOP Type II 24-Pin Plastic TSSOP Type I TEMPERATURE RANGE -40C to +85C -40C to +85C -40C to +85C -40C to +85C OUTSIDE NORTH AMERICA 74ABT841 N 74ABT841 D 74ABT841 DB 74ABT841 PW NORTH AMERICA 74ABT841 N 74ABT841 D 74ABT841 DB 74ABT841PW DH DWG NUMBER SOT222-1 SOT137-1 SOT340-1 SOT355-1
PIN CONFIGURATION
OE D0 D1 D2 D3 D4 D5 D6 D7 1 2 3 4 5 6 7 8 9 TOP VIEW 24 23 22 21 20 19 18 17 16 15 14 13 VCC Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7 Q8 Q9 LE
PIN DESCRIPTION
PIN NUMBER 1 2, 3, 4, 5, 6, 7, 8, 9, 10, 11 23, 22, 21, 20, 19, 18, 17, 16, 15, 14 13 12 24 SYMBOL OE D0-D9 Q0-Q9 LE GND VCC FUNCTION Output enable input (active-Low) Data inputs Data outputs Latch enable input (active falling edge) Ground (0V) Positive supply voltage
D8 10 D9 11 GND 12
SA00247
1995 Sep 06
1
853-1628 15703
Philips Semiconductors
Product specification
10-bit bus interface latch (3-State)
74ABT841
LOGIC SYMBOL
FUNCTION TABLE
INPUTS OE LE H H X L Dn L H l h X X OUTPUTS Q0 - Q9 L H L H Z NC Transparent Latched High impedance Hold OPERATING MODE
2
3
4
5
6
7
8
9
10 11
L L L L H
D0 D1 D2 D3 D4 D5 D6 D7 D8 D9
13 1
LE OE Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7 Q8 Q9
L
23 22 21 20 19 18 17 16 15 14
H = High voltage level h = High voltage level one set-up time prior to the High-to-Low LE transition L = Low voltage level l = Low voltage level one set-up time prior to the High-to-Low LE transition = High-to-Low LE transition NC= No change X = Don't care Z = High impedance "off" state
SA00244
LOGIC SYMBOL (IEEE/IEC)
1 13
EN C1
2 3 4 5 6 7 8 9 10 11
1D
23 22 21 20 19 18 17 16 15 14
SA00245
1995 Sep 06
2
Philips Semiconductors
Product specification
10-bit bus interface latch (3-State)
74ABT841
LOGIC DIAGRAM
D0 2 D1 3 D2 4 D3 5 D4 6 D5 7 D6 8 D7 9 D8 10 D9 11
D
D
D
D
D
D
D
D
D
D
L
Q
L
Q
L
Q
L
Q
L
Q
L
Q
L
Q
L
Q
L
Q
L
Q
13 LE
1 OE 23 Q0 22 Q1 21 Q2 20 Q3 19 Q4 18 Q5 17 Q6 16 Q7 15 Q8 14 Q9 SA00246
ABSOLUTE MAXIMUM RATINGS1, 2
SYMBOL VCC IIK VI IOK VOUT IOUT Tstg PARAMETER DC supply voltage DC input diode current DC input voltage3 VO < 0 output in Off or High state output in Low state VI < 0 CONDITIONS RATING -0.5 to +7.0 -18 -1.2 to +7.0 -50 -0.5 to +5.5 128 -65 to 150 UNIT V mA V mA V mA C
DC output diode current DC output voltage3
DC output current Storage temperature range
NOTES: 1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150C. 3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
RECOMMENDED OPERATING CONDITIONS
SYMBOL PARAMETER Min VCC VI VIH VIL IOH IOL t/v Tamb DC supply voltage Input voltage High-level input voltage Low-level input voltage High-level output current Low-level output current Input transition rise or fall rate Operating free-air temperature range 0 -40 4.5 0 2.0 0.8 -32 64 5 +85 LIMITS Max 5.5 VCC V V V V mA mA ns/V C UNIT
1995 Sep 06
3
Philips Semiconductors
Product specification
10-bit bus interface latch (3-State)
74ABT841
DC ELECTRICAL CHARACTERISTICS
LIMITS SYMBOL PARAMETER TEST CONDITIONS Tamb = +25C Min VIK Input clamp voltage VCC = 4.5V; IIK = -18mA VCC = 4.5V; IOH = -3mA; VI = VIL or VIH VOH High-level output voltage VCC = 5.0V; IOH = -3mA; VI = VIL or VIH VCC = 4.5V; IOH = -32mA; VI = VIL or VIH VOL VRST II IOFF IPU/PD IIH + IOZH IIL + IOZL ICEX IO ICCH ICCL ICCZ ICC Additional supply current per input pin2 Quiescent supply current Low-level output voltage Power-up output low voltage3 Input leakage current Control pins Data pins VCC = 4.5V; IOL = 64mA; VI = VIL or VIH VCC = 5.5V; IO = 1mA; VI = GND or VCC VCC = 5.5V; VI = GND or 5.5V VCC = 5.5V; VI = GND or 5.5V VCC = 0.0V; VO or VI 4.5V VCC = 2.0V; VO = 0.5V; VI = GND or VCC; V OE = VCC VCC = 5.5V; VO = 2.7V; VI = VIL or VIH VCC = 5.5V; VO = 0.5V; VI = VIL or VIH VCC = 5.5V; VO = 5.5V; VI = GND or VCC VCC = 5.5V; VO = 2.5V VCC = 5.5V; Outputs High, VI = GND or VCC VCC = 5.5V; Outputs Low, VI = GND or VCC VCC = 5.5V; Outputs 3-State; VI = GND or VCC One input at 3.4V, other inputs at VCC or GND; VCC = 5 5V 5.5V -50 2.5 3.0 2.0 Typ -0.9 3.5 4.0 2.6 0.42 0.13 0.01 5 5.0 5.0 5.0 -5.0 5.0 -100 0.5 25 0.5 0.5 05 0.55 0.55 1.0 100 100 50 50 -50 50 -180 250 38 250 1.5 15 -50 Max -1.2 2.5 3.0 2.0 0.55 0.55 1.0 100 100 50 50 -50 50 -180 250 38 250 1.5 15 Tamb = -40C to +85C Min Max -1.2 V V V V V V A A A A A A A mA A mA A mA A UNIT
Power-off leakage current Power-up/down 3-state output current4 3-State output High current 3-State output Low current Output high leakage current Output current1
NOTES: 1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second. 2. This is the increase in supply current for each input at 3.4V. 3. For valid test results, data must not be loaded into the flip-flops (or latches) after applying the power. 4. This parameter is valid for any VCC between 0V and 2.1V with a transition time of up to 10msec. For VCC = 2.1V to VCC = 5V " 10%, a transition time of up to 100sec is permitted.
AC CHARACTERISTICS
GND = 0V, tR = tF = 2.5ns, CL = 50pF, RL = 500 LIMITS SYMBOL PARAMETER WAVEFORM Min tPLH tPHL tPLH tPHL tPZH tPZL tPHZ tPLZ Propagation delay Dn to Qn Propagation delay LE to Qn Output enable time to High and Low level Output disable time from High and Low level 2 1 4 5 4 5 2.1 2.0 2.1 2.8 1.0 2.2 2.7 2.8 Tamb = +25oC VCC = +5.0V Typ 4.1 4.0 4.1 4.6 3.0 4.1 4.7 4.6 Max 5.5 5.5 5.9 6.2 4.5 5.6 6.2 6.1 Tamb = -40 to +85oC VCC = +5.0V 0.5V Min 2.1 2.0 2.1 2.8 1.0 2.2 2.7 2.8 Max 6.2 6.2 6.5 6.7 5.3 6.3 7.1 6.5 ns ns ns ns UNIT
1995 Sep 06
4
Philips Semiconductors
Product specification
10-bit bus interface latch (3-State)
74ABT841
AC SETUP REQUIREMENTS
GND = 0V, tR = tF = 2.5ns, CL = 50pF, RL = 500 LIMITS SYMBOL PARAMETER WAVEFORM Tamb = +25oC VCC = +5.0V Min ts(H) ts(L) th(H) th(L) tw(H) tw(L) Setup time, High or Low Dn to LE Hold time, High or Low Dn to LE LE pulse width High or Low 3 3 1 2.5 1.5 1.5 1.0 3.3 Typ 1.0 0.0 0.2 -0.8 1.9 Tamb = -40 to +85oC VCC = +5.0V 0.5V Min 2.5 1.5 1.5 1.0 3.3 ns ns ns UNIT
AC WAVEFORMS
VM = 1.5V, VIN = GND to 3.0V
LE
VM tw(H) tPHL
VM
VM
OE
VM tPZH
VM tPHZ VOH-0.3V 0V
tPLH Qn VM
Qn
VM
VM
SA00248
SA00066
Waveform 1. Propagation Delay, Latch Enable Input to Output, and Enable Pulse Width
Waveform 4. 3-State Output Enable Time to High Level and Output Disable Time from High Level
Dn
VM tPLH
VM tPHL
OE
VM tPZL
VM tPLZ
Qn
VM
VM
Qn
VM
VOL+0.3V 0V
SA00064
SA00067
Waveform 2. Propagation Delay for Data to Outputs
Waveform 5. 3-State Output Enable Time to Low Level and Output Disable Time from Low Level
Dn
LE
1995 Sep 06
EEEEEEEEE EEE E EEE E EEEEEEEEE EEE EEEEEEE EEE
VM VM VM VM ts(H) th(H) ts(L) th(L) VM VM NOTE: The shaded areas indicate when the input is permitted to change for predictable output performance. SA00249
Waveform 3. Data Setup and Hold Times
5
Philips Semiconductors
Product specification
10-bit bus interface latch (3-State)
74ABT841
TEST CIRCUIT AND WAVEFORM
VCC 7.0V RL 90% NEGATIVE PULSE VM 10% tTHL (tF) CL RL POSITIVE PULSE 10% tW tTLH (tR) 90% 90% VM 10% 0V 10% 0V tTLH (tR) tTHL (tF) AMP (V) tW VM 90% AMP (V)
PULSE GENERATOR
VIN D.U.T. RT
VOUT
Test Circuit for 3-State Outputs
VM
SWITCH POSITION
TEST tPLZ tPZL All other SWITCH closed closed open
VM = 1.5V Input Pulse Definition
DEFINITIONS
RL = Load resistor; see AC CHARACTERISTICS for value. CL = Load capacitance includes jig and probe capacitance; see AC CHARACTERISTICS for value. RT = Termination resistance should be equal to ZOUT of pulse generators.
INPUT PULSE REQUIREMENTS FAMILY Amplitude 74ABT 3.0V Rep. Rate 1MHz tW 500ns tR 2.5ns tF 2.5ns
SA00012
1995 Sep 06
6


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